By Topic

Unsupervised Learning of Probabilistic Grammar-Markov Models for Object Categories

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Long Zhu ; Dept. of Stat., California Univ., Los Angeles, CA ; Yuanhao Chen ; Yuille, A.

We introduce a probabilistic grammar-Markov model (PGMM) which couples probabilistic context free grammars and Markov random fields. These PGMMs are generative models defined over attributed features and are used to detect and classify objects in natural images. PGMMs are designed so that they can perform rapid inference, parameter learning, and the more difficult task of structure induction. PGMMs can deal with unknown 2D pose (position, orientation, and scale) in both inference and learning, different appearances, or aspects, of the model. The PGMMs can be learnt in an unsupervised manner where the image can contain one of an unknown number of objects of different categories or even be pure background. We first study the weakly supervised case, where each image contains an example of the (single) object of interest, and then generalize to less supervised cases. The goal of this paper is theoretical but, to provide proof of concept, we demonstrate results from this approach on a subset of the Caltech dataset (learning on a training set and evaluating on a testing set). Our results are generally comparable with the current state of the art, and our inference is performed in less than five seconds.

Published in:

Pattern Analysis and Machine Intelligence, IEEE Transactions on  (Volume:31 ,  Issue: 1 )