Cart (Loading....) | Create Account
Close category search window
 

Influence of High Temperature Superconducting Transformer Geometry on Leakage Magnetic Field

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Xiaosong Li ; Changsha Univ. of Sci. & Technol., Changsha ; Suping Wu ; Yusheng Zhou ; Gui Hu
more authors

Leakage magnetic fields in high temperature superconducting (HTS) transformer windings reduce the critical current and increase the ac losses in HTS tapes. Moreover, because of the anisotropic properties of the HTS tapes, the influence of the radial component of the leakage field on critical current and ac losses is much stronger than that of the axial one. For these reasons, leakage magnetic fields must be carefully considered in HTS transformer design. In this paper, we report a study of the influence of the core structure and the winding configuration on the leakage field by the finite-element method (FEM), and offer some suggestions for reducing the maximal radial component of leakage field to make the HTS transformer more efficient.

Published in:

Magnetics, IEEE Transactions on  (Volume:44 ,  Issue: 4 )

Date of Publication:

April 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.