Close category search window
 

Effect of Catalyst Film Thickness on the Growth, Microstructure and Field Emission Characteristics of Carbon Nanotubes

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Srivastava, S.K. ; Nat. Phys. Lab., New Delhi ; Vankar, V.D. ; Kumar, V.

Aligned multiwalled carbon nanotubes (CNTs) were grown by microwave plasma enhanced chemical vapor deposition on Si substrates using C2H2 and NH3 gas mixture. Effect of Fe film thickness (5-30 nm) on the growth, microstructure and field emission characteristics of CNT films were investigated. Both Fe particle size and CNTs diameter increased with Fe thickness but CNTs length decreased. CNTs grown up to a Fe thickness of 20 nm, were found to have mainly well arranged bamboo-structures. However, for higher Fe thickness, CNTs were found to have mostly dual structural feature (solid fiberlike + bamboo- structure). It is suggested that relative rates of bulk and surface diffusions of carbon, which is catalyst size dependent, are responsible for such structural features. Field emission measurements of the CNT films showed turn-on field to be 1.6-3.2 V/ mum.

Published in:
Physics of Semiconductor Devices, 2007. IWPSD 2007. International Workshop on

Date of Conference: 16-20 Dec. 2007

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.