By Topic

An Efficient Method for Large-Scale Gate Sizing

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Joshi, S. ; Dept. of Electr. Eng., Stanford Univ., Stanford, CA ; Boyd, S.

We consider the problem of choosing the gate sizes or scale factors in a combinational logic circuit in order to minimize the total area, subject to simple RC timing constraints, and a minimum-allowed gate size. This problem is well known to be a geometric program (GP), and can be solved by using standard interiorpoint methods for small- and medium-size problems with up to several thousand gates. In this paper, we describe a new method for solving this problem that handles far larger circuits, up to a million gates, and is far faster. Numerical experiments show that our method can compute an adequately accurate solution within around 200 iterations; each iteration, in turn, consists of a few passes over the circuit. In particular, the complexity of our method, with a fixed number of iterations, is linear in the number of gates. A simple implementation of our algorithm can size a 10 000 gate circuit in 25 s, a 100 000 gate circuit in 4 min, and a million gate circuit in 40 min, approximately. For the million gate circuit, the associated GP has three million variables and more than six million monomial terms in its constraints; as far as we know, these are the largest GPs ever solved.

Published in:

Circuits and Systems I: Regular Papers, IEEE Transactions on  (Volume:55 ,  Issue: 9 )