Cart (Loading....) | Create Account
Close category search window

An Automated Method for Gridding in Microarray Images

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Giannakeas, N. ; Lab. of Biol. Chem., Ioannina Univ. ; Fotiadis, D.I. ; Politou, A.S.

Microarray technology is a powerful tool for analyzing the expression of a large number of genes in parallel. A typical microarray image consists of a few thousands of spots which determine the level of gene expression in the sample. In this paper we propose a method which automatically addresses each spot area in the image. Initially, a preliminary segmentation of the image is produced using a template matching algorithm. Next, grid and spot finding are realized. The position of non-expressed spots is located and finally a Voronoi diagram is employed to fit the grid on the image. Our method has been evaluated in a set of five images consisting of 45960 spots, from the Stanford microarray database and the reported accuracy for spot detection was 93%

Published in:

Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE

Date of Conference:

Aug. 30 2006-Sept. 3 2006

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.