Cart (Loading....) | Create Account
Close category search window

Real-Time Ocular Artifacts Suppression from EEG Signals Using an Unsupervised Adaptive Blind Source Separation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Shayegh, F. ; Dept. of Biomed. Eng., Iran Univ. of Sci. & Technol., Tehran ; Erfanian, A.

Independent component analysis (ICA) has been shown to be a powerful tool for artifactual suppression from electroencephalogram (EEG) recordings. However, the real-time application of this method for artifact rejection has not been considered so far. This article presents a method based on an unsupervised, self-normalizing, adaptive learning algorithm for on-line blind source separation. Simulation results are provided to show the validity and effectiveness of the technique with different distributions. The results from real-data demonstrate that the proposed scheme removes perfectly eye blink and eye movement artifacts from the EEG signals and is suitable for use during on-line EEG monitoring such as EEG-based brain computer interface

Published in:

Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE

Date of Conference:

Aug. 30 2006-Sept. 3 2006

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.