By Topic

Modeling the time-varying microstructure of simulated sleep EEG spindles using time-frequency analysis methods

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
P. Xanthopoulos ; Department of Electronic and Computer Engineering, Technical University of Crete, Greece ; S. Golemati ; V. Sakkalis ; P. Y. Ktonas
more authors

The time-varying microstructure of sleep spindles may have clinical significance and can be quantified and modeled with a number of techniques. In this paper, sleep spindles were regarded as AM-FM signals modeled by six parameters. The instantaneous envelope (IE) and instantaneous frequency (IF) waveforms were estimated using four different methods, namely Hilbert Transform (HT), Complex Demodulation (CD), Wavelet Transform (WT) and Matching Pursuit (MP). The six model parameters were subsequently estimated from the IE and IF waveforms. The average error, taking into account the error for each model parameter, was lowest for HT, higher but still less than 10% for CD and MP, and highest (greater than 10%) for WT, for three different spindle model examples. The amount of distortion induced by the use of a given method is also important; distortion was the greatest (0.4 sec) in the case of HT. Therefore, in the case of real spindles, one could utilize CD and MP and, if the spindle duration is more than 1 sec, HT as well

Published in:

Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE

Date of Conference:

Aug. 30 2006-Sept. 3 2006