By Topic

Optical Reflectometry for In-situ Monitoring of Carbon Nanotubes Deposition by Optical Tweezers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Ken Kashiwagi ; Department of Electronic Engineering, Graduate School of Engineering, The University of Tokyo, 7-3-1 Hongo, Bunkyo-Ku, Tokyo 113-8656, JAPAN. Tel: +81-3-5841-6783, Fax: +81-3-5841-6025. e-mail: ; Shinji Yamashita ; Sze Yun Set

Reflectometry is adopted for in-situ monitoring of carbon nanotubes deposition to fiber end by optical tweezers. Reflectivity increases drastically once CNTs are deposited, and enhancement of layer uniformity is observed through damping of reflectivity fluctuation.

Published in:

2007 Conference on Lasers and Electro-Optics (CLEO)

Date of Conference:

6-11 May 2007