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Optical Reflectometry for In-situ Monitoring of Carbon Nanotubes Deposition by Optical Tweezers

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3 Author(s)
Ken Kashiwagi ; Department of Electronic Engineering, Graduate School of Engineering, The University of Tokyo, 7-3-1 Hongo, Bunkyo-Ku, Tokyo 113-8656, JAPAN. Tel: +81-3-5841-6783, Fax: +81-3-5841-6025. e-mail: kasiwagi@sagnac.t.u-tokyo.ac.jp ; Shinji Yamashita ; Sze Yun Set

Reflectometry is adopted for in-situ monitoring of carbon nanotubes deposition to fiber end by optical tweezers. Reflectivity increases drastically once CNTs are deposited, and enhancement of layer uniformity is observed through damping of reflectivity fluctuation.

Published in:

2007 Conference on Lasers and Electro-Optics (CLEO)

Date of Conference:

6-11 May 2007