By Topic

21st International Conference on VLSI Design - Title page

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.

The following topics are dealt with: fault tolerance; wireless communication; embedded systems; testing/DFT; interconnects; analog performance; physical design/CAD; low power electronics; on-chip networks; design/MEMS/optical; circuit synthesis; standards in EDA.

Published in:

21st International Conference on VLSI Design (VLSID 2008)

Date of Conference:

4-8 Jan. 2008