On the Interplay Between the Equipment Under Test and TEM Cells

In all applications of the gigahertz transverse electromagnetic (GTEM) cell, there is an interplay between the equipment under test (EUT) and the cell reflecting metal walls, as represented by images of the EUT. Moreover, owing to the multiple reflections within the cell and to its tapering structure, the phenomenon of illumination and reillumination of the EUT can hardly be avoided. These problems, known as reactive effects of the cell, are investigated in this paper. A simple new approach for an efficient investigation of the interactions between the EUT and the cell is provided. Closed-form expressions for the reflection coefficient, the relative deviation in field, and the relative error in the induced current caused by the reactive effect of the cell are derived. Each of these expressions encompasses both the mutual influence of the EUT's radar cross section (RCS) and the reactive effects of the cell. It is shown that depending on the frequency-dependent phase factor $e^{j\psi}$, strong and weak test conditions may occur since the overall incident field will exhibit maxima and minima. Hence, evidence showing that the total incident field impinging on the EUT generally deviates from the primary excited TEM field is provided. Moreover, the relative deviation in the field and the relative error in the induced current are quantified. Finally, the frequency dependence of the well-known one-third-rule of thumb is demonstrated.