Referenced Items are not available for this document.
As device geometries shrink and power supply voltages decrease, simultaneous switching noise has increasingly detrimental effects on IC reliability. The authors investigate the worst-case conditions for SSN generated by a single switching wire and analyze the impact of transition-reducing encoding on SSN. They show that switching-pattern and layout considerations have a significant impact on TRE performance.
Published in:
Design & Test of Computers, IEEE
(Volume:25
,
Issue:
1
)
Date of Publication: Jan.-Feb. 2008
- Page(s):
- 76 - 86
- ISSN :
- 0740-7475
- INSPEC Accession Number:
- 9775715
- Digital Object Identifier :
- 10.1109/MDT.2008.25
- Date of Current Version :
- 08 February 2008
- Issue Date :
- Jan.-Feb. 2008
- Sponsored by :
- IEEE Council on Electronic Design and Automation
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