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Light-Enhanced FET Switch Improves ATE RF Power Settling

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4 Author(s)
Kelly, J. ; Verigy Inc., Cupertino ; Lowery, E. ; Nicholson, D. ; Grothen, V.

RFIC testing requires cost-effective and innovative hardware implementation. The authors of this article have dramatically improved the speed of RF switches on high-performance ATE by shining a bright light on the switches. This solution provides practical, cost-effective RF testing.

Published in:

Design & Test of Computers, IEEE  (Volume:25 ,  Issue: 1 )