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A New Method for RTS Noise of Semiconductor Devices Identification

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3 Author(s)
Alicja Konczakowska ; Gdansk Univ. of Technol., Gdansk ; Jacek Cichosz ; Arkadiusz Szewczyk

In this paper, a new method, called the noise scattering pattern method (NSP method), for random telegraph signal noise identification in the inherent noise of semiconductor devices is described. A block diagram of a noise measurement system based on the NSP method is presented. Examples of patterns of the NSP method are included.

Published in:

IEEE Transactions on Instrumentation and Measurement  (Volume:57 ,  Issue: 6 )