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Study on Interconnect Test Generation of MCM Based on Particle Swarm Optimization Algorithm and Genetic Algorithm

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1 Author(s)
Lei Chen ; Guilin Univ. of Electron. Technol., Guilin

The paper proposes a new interconnect test generation approach based on particle swarm optimization algorithm (PSO) and genetic algorithm (GA) for multi-chip module (MCM) applications. By combing the characteristics of interconnect test and constructing particle expression of test generation, the velocity updating equation and position updating equation of discrete PSO is presented in tins paper. GA is employed to evolve the candidates generated by PSO. in order to improve the fault coverage of the test vector. The experimental results for MCM benchmark circuits show that the proposed algorithm can improve the performance of interconnect test generation in test set. fault coverage and CPU time when compared to other interconnect test generation algorithms.

Published in:

Electronic Packaging Technology, 2007. ICEPT 2007. 8th International Conference on

Date of Conference:

14-17 Aug. 2007

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