By Topic

Fault Location for Single-Circuit Line Based on Bus-Impedance Matrix Utilizing Voltage Measurements

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Yuan Liao ; Univ. of Kentucky, Lexington

Diverse transmission line fault location algorithms have been proposed in the past depending on measurements available. Existing algorithms usually require measurements captured from buses of a faulted line. By taking advantage of the bus-impedance matrix technique, this paper presents a possible fault location approach for single-circuit lines utilizing only voltage measurements from one or two buses, which may be distant from the faulted line. With the addition of a fictitious bus where the fault occurs, the transfer impedances of this bus and other buses are revealed as a function of the fault location. Based on the relationship between the bus voltage change due to fault and the transfer impedance, the fault location can be derived. Shunt capacitance of the line is ignored first and then fully considered based on distributed parameter line model. Electromagnetic transients program simulation studies have shown quite encouraging results.

Published in:

Power Delivery, IEEE Transactions on  (Volume:23 ,  Issue: 2 )