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Circuit failure prediction to overcome scaled CMOS reliability challenges

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2 Author(s)
Subhasish Mitra ; Departments of Electrical Engineering and Computer Science, Stanford University, CA, USA ; Mridul Agarwal

Circuit failure prediction predicts the occurrence of a circuit failure before errors actually appear in system data and states. This is in contrast to traditional error detection where a failure is detected after errors appear in system data and states. Circuit failure prediction can be performed in multiple ways -the basic principle is to insert a wide variety of "sensors" at various locations inside a chip. These sensors collect information about various system parameters over time concurrently during normal system operation or during periodic on-line self-test.

Published in:

2007 IEEE International Test Conference

Date of Conference:

21-26 Oct. 2007