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Schematic-Based Fault Dictionary: A Case Study

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2 Author(s)
AbdEl-Halim, M.A. ; Mentor Graphics Egypt, Cairo ; Amer, H.H.

This paper uses the opamp1 benchmark circuit to show that existing fault models are not accurate enough in the context of defect-based tests. A simple DFT circuit is added to increase coverage to 100% without affecting normal circuit operation. Furthermore, it is shown that this DFT circuit changes the operation modes of insensitive transistors.

Published in:

Design and Test Workshop, 2007. IDT 2007. 2nd International

Date of Conference:

16-18 Dec. 2007