By Topic

Improvement of the imaging resolution for a Compton camera by determination of the interaction depth in a 25-segmented germanium detector

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)

The imaging resolution in a Compton camera depends mainly on the position uncertainty, which is affected by the size of electrodes in a detector. Therefore, if any other method is not used for the reduction of the position uncertainty, the imaging resolution is limited by the size of electrodes. Recently, we have developed a Compton camera consisting of a double-sided silicon strip detector (DSSD) and a 25-segmented germanium detector (25-SEGD). The 25-SEGD has an active volume of 5 x 5 x 2 cm3. We have performed measurement for determination of the interaction depth in the 25-SEGD using the pulse shape analysis. After getting a rise-time correlation between the anode and the segment, we obtained a relation formula between the rise-time of the detector signal and the depth derived from the decay equation of gamma-ray in the detector. This decay formula has been used for the determination of interaction depth. As a result of applying the relation function to image reconstruction, we could improve the imaging resolution.

Published in:

Nuclear Science Symposium Conference Record, 2007. NSS '07. IEEE  (Volume:6 )

Date of Conference:

Oct. 26 2007-Nov. 3 2007