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Based on CMOS Geiger photodiode (GPD) pixels developed at RMD Inc. and fabricated with MOSIS consortium, we present a detector design that is capable of providing highspeed and single optical photon sensitivity in the near infrared region. The integration of the electronic reset with these CMOS pixels enables their use in a cost-effective large imaging array to provide a substantial increase in the signal-to-noise ratio and facilitate the high-speed, pixel-level signal processing required for photon-counting Diffuse Correlation Tomography (DCT). DCT is an imaging technique in progress that promises to provide a method for routine, non-invasive cancer screening and treatment by imaging blood flow, tissue oxygenation, and the distinct vasculature associated with the angiogenesis of cancerous growth using non-ionizing radiation. In this work, we present results of the design, fabrication and characterization of the CMOS Geiger pixels and their associated integrated reset circuits for DCT measurements.