By Topic

A VHDL-AMS Simulation Environment for an UWB Impulse Radio Transceiver

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Mario R. Casu ; Dept. of Electron., Politec. di Torino, Turin ; Marco Crepaldi ; Mariagrazia Graziano

Ultrawideband (UWB) communication based on the impulse radio paradigm is becoming increasingly popular. According to the IEEE 802.15 WPAN low rate alternative PHY Task Group 4a, UWB will play a major role in localization applications, due to the high time resolution of UWB signals which allow accurate indirect measurements of distance between transceivers. Key for the successful implementation of UWB transceivers is the level of integration that will be reached, for which a simulation environment that helps take appropriate design decisions is crucial. Owing to this motivation, in this paper we propose a multiresolution UWB simulation environment based on the VHDL-AMS hardware description language, along with a proper methodology which helps tackle the complexity of designing a mixed-signal UWB system-on-chip. We applied the methodology and used the simulation environment for the specification and design of an UWB transceiver based on the energy detection principle. As a by-product, simulation results show the effectiveness of UWB in the so-called ranging application, that is the accurate evaluation of the distance between a couple of transceivers using the two-way-ranging method.

Published in:

IEEE Transactions on Circuits and Systems I: Regular Papers  (Volume:55 ,  Issue: 5 )