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Scanning photocurrent microscopy in semiconducting carbon nanotube transistors

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2 Author(s)
Yeonghwan Ahn ; Division of Energy Systems Research, Ajou University, Suwon 443-749, Korea ; Jiwoong Park

Scanning photocurrent measurements are demonstrated in individual carbon nanotube field effect transistors. Photocurrent images in conjunction with the electrical conductance measurement elucidate the properties of metal-CNT interfaces, especially the electron band alignment at the contact.

Published in:

Quantum Electronics and Laser Science Conference, 2007. QELS '07

Date of Conference:

6-11 May 2007