By Topic

Test Yield Improvement of Class II Bluetooth Devices Through Power Output Optimization Via Circuit Element Tuning

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Rabago, J.C. ; NXP Semicond., Cabuyao ; Quillosa, A.N.

To guarantee that products meet acceptance test specifications, final test is performed at the end of the assembly process. This is done to screen-out units that are possible defects before they are being delivered to the customer. Bluetooth devices also undergo final test using parameters that are defined by the Bluetooth specifications. One of the parameters in the final test is P_2480 (output power at channel 78 with a frequency of 2480 MHz), which ensures that the output power level of the device is within the limits that are defined by the customer. This study was conducted for the reason that power rejects most specifically on channel 78, are becoming primary in the major factors that contribute in low-test yield. Improving the product's output power performance through evaluations and tuning of elements that make up the circuit, will reduce if not eliminate low power rejects on channel 78 (2480 MHz), and therefore increase the final test yield.

Published in:

Electronic Materials and Packaging, 2006. EMAP 2006. International Conference on

Date of Conference:

11-14 Dec. 2006