Cart (Loading....) | Create Account
Close category search window
 

Multiple source localization in shallow ocean using a uniform linear horizontal array of acoustic vector sensors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Arunkumar, K.P. ; Indian Inst. of Sci., Bangalore ; Anand, G.V.

A novel approach to 3D localization of narrowband acoustic sources in a shallow ocean using a horizontal array of acoustic vector sensors (AVS) is proposed. It is shown that, if the number of sources J is known, the maximum likelihood (ML) estimates of 3/ source parameters (azimuth angles, ranges and depths) can be found in two successive stages - a J dimensional search for azimuth angles in the bounded parameter space [0 2pi]J, followed by an ML estimation of source amplitudes to obtain source range and depth. When J is not known, a stochastic search based on reversible jump Markov chain Monte Carlo (MCMC) strategy is proposed, which effectively performs the dual task of joint estimation of the number of sources and their location parameters.

Published in:

TENCON 2007 - 2007 IEEE Region 10 Conference

Date of Conference:

Oct. 30 2007-Nov. 2 2007

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.