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A Histogram-Based Testing Method for Estimating A/D Converter Performance

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3 Author(s)
Hsin-Wen Ting ; Nat. Cheng Kung Univ., Tainan ; Bin-Da Liu ; Soon-Jyh Chang

A sine-wave histogram-testing structure for analog-to-digital converters (ADCs) is proposed. The ADC static parameters, i.e., offset error, gain error, and nonlinearity errors, are directly obtained from the sine-wave histogram test. Then, the obtained static parameters are related to the estimation of the degraded signal-to-noise ratio (SNR) value. Therefore, the relationships among these parameters are analyzed, and a single sine-wave histogram test can be performed to evaluate the ADC. With the appropriate approximations in the reference sine-wave histograms and the estimations of the ADC parameters, the realization of an ADC output analyzer circuit could be a simple task. An ADC output analyzer circuit is therefore developed and synthesized using a 0.18-mum technique to analyze the outputs of an 8-bit ADC and estimate its performances using the proposed method.

Published in:

IEEE Transactions on Instrumentation and Measurement  (Volume:57 ,  Issue: 2 )