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40 frames/sec 16×16 temperature probe array using 90nm 1V CMOS for on-line thermal monitoring on VLSI chip

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4 Author(s)
Masahiro Sasaki ; VLSI Design and Education Center (VDEC), The University of Tokyo, Japan ; Takuro Inoue ; Makoto Ikeda ; Kunihiro Asada

This paper presents a 16times16 temperature probe array using 90 nm IV CMOS, which shows plusmn1.4degC error for 40 ~ 110degC temperature range and achieves a temperature distribution measurement at 40 frames/sec. This array is designed and developed for an operating frequency and supply voltage feedback system corresponding to temperature of each block on a VLSI chip. The continuous thermal monitoring is performed by using accurate four-transistor temperature probe circuits with an error amplifier and two PMOS current sources.

Published in:

Solid-State Circuits Conference, 2007. ASSCC '07. IEEE Asian

Date of Conference:

12-14 Nov. 2007