Close category search window
 

Research of influence of transients, non-equidistance of the taken readings, divergence of beams on characteristics of interferometric SAR

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Zolotarev, I.D. ; Omsk State Univ. (OmSU), Omsk ; Pozharsky, T.O. ; Miller, Ya.E.

There is under consideration a combined influence of the transients in the filters of the radar system selective circuits, non-equidistance of the taken readings and divergence of the beams at the distance up to the earth surface reflecting elements that is comparable with a synthetic antenna aperture value. There is taken into account influence of the above-mentioned factors on the resolution capability of the radar system for the earth remote sensing. The transients lead to swinging of the SAR antenna pattern; the other indicated factors result in widening of the synthetic antenna pattern. There are given the corresponding relationships and diagrams that make it possible to take into account the influence of the above-mentioned factors and determine the ways for reduction of the destructive factors influence on the synthetic antenna pattern.

Published in:
Geoscience and Remote Sensing Symposium, 2007. IGARSS 2007. IEEE International

Date of Conference: 23-28 July 2007

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.