By Topic

Polarimetric optical tools and decompositions applied to SAR images

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Colin, E.K. ; Chemin de la Huniere, Palaiseau

Radar polarimetry aims to determine the scattering properties of a target or scatterer. For this purpose, the scattering matrix can be analyzed and represented in several ways using various techniques to extract information about the scattering mechanisms. Polarimetry and ellipsometry are techniques which both study the properties of the polarization of the scattered waves but traditionally refer to different wavelengths: optical wavelengths for ellipsometry, and high-frequencies radio waves for radar polarimetry. This paper deals with natural targets in the general bistatic case, for which the 16 parameters of the Mueller matrix are independent. We try to answer the following questions: how to deduce the radar polarimetric parameters from the optical measurements of a Mueller ellipsometer? What are the polarimetric parameters traditionally devoted to optical images, and in which extent is it possible to apply and interpret them in the case of SAR images?

Published in:

Geoscience and Remote Sensing Symposium, 2007. IGARSS 2007. IEEE International

Date of Conference:

23-28 July 2007