By Topic

Study on the Model of Analysis and Control of Parallel Measurement Systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
He Shu-guang ; Tianjin Univ., Tianjin ; Qi Er-shi ; Li Li

Parallel measurement systems are widely used in modern manufacturing systems. It is not feasible to analyze this kind of measurement systems with the traditional MSA (measurement system analysis) method. Thus two measurement analysis models for the parallel measurement systems are put forward. One is for the analysis of the variation between the instruments and the other is for the analysis of the time variation of one instrument. In the first model, the different measurement instruments are seen as the source of variation. With this MSA model, the GR&R (gauge repeatability and reproducibility) of the parallel measurement system can be calculated. If the GR&R is less than 15 percent, the instruments of the parallel measurement systems can be seen as one. And in the second model, the time is seen as the source of variation and the stability of an instrument is analyzed. Based on the result of MSA, a SPC (statistical process control) model for the parallel measurement systems is put forward and the variation of the products and different instruments can be controlled at the same time. At last, a case in mobile telephone assembly is studied.

Published in:

Management Science and Engineering, 2007. ICMSE 2007. International Conference on

Date of Conference:

20-22 Aug. 2007