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Properties of continuous analog estimators for a discrete reliability-growth model

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3 Author(s)
Bhattacharyya, G.K. ; Wisconsin Univ., Madison, WI, USA ; Fries, A. ; Johnson, R.A.

A discrete reliability-growth model (appropriate for success-failure data) whose derivation parallels that of a popular nonhomogeneous Poisson process model (appropriate for continuous failure time data) is considered.,Following J. M. Finkelstein (ibid. vol.R-32, p.508-11, Dec. 1983) continuous analog estimators are defined for use with the discrete model when there is a constant prespecified number of test trials between system configuration changes. The large-sample properties of these estimators, including consistency and normality, are established. Large-sample standard-error formulas and confidence interval procedures are developed

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Reliability, IEEE Transactions on  (Volume:38 ,  Issue: 3 )