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Analysis of the Field Distribution inside Dielectric Object Loaded in TEM Cell Using Hybrid FEM-BEM Method

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1 Author(s)
Hu Yu-sheng ; Jimei Univ., Xiamen

The field distribution inside the dielectric equipment under test (EUT) loaded in transverse electromagnetic (TEM) cell is researched. The FEM-BEM domain decomposition method was proposed. For the EUT, which is the interested region, the finite element method was applied, while for the TEM cell the boundary element method is used. This method reduces the computational time and memory requirement. The results obtained by the hybrid FEM-BEM method are compared with those obtained by other methods. The present method is an efficient technique, which can be widely used for the analysis of field distribution inside the complicated dielectric EUT surrounded by large or infinite electromagnetic field.

Published in:
Electromagnetic Compatibility, 2007. EMC 2007. International Symposium on

Date of Conference: 23-26 Oct. 2007

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