Cart (Loading....) | Create Account
Close category search window

The von Kries Hypothesis and a Basis for Color Constancy

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Chong, H.Y. ; Harvard Univ., Cambridge ; Gortler, S.J. ; Zickler, T.

Color constancy is almost exclusively modeled with diagonal transforms. However, the choice of basis under which diagonal transforms are taken is traditionally ad hoc. Attempts to remedy the situation have been hindered by the fact that no joint characterization of the conditions for {sensors, illuminants, reflectances} to support diagonal color constancy has previously been achieved. In this work, we observe that the von Kries compatibility conditions are impositions only on the sensor measurements, not the physical spectra. This allows us to formulate the von Kries compatibility conditions succinctly as rank constraints on an order 3 measurement tensor. Given this, we propose an algorithm that computes a (locally) optimal choice of color basis for diagonal color constancy and compare the results against other proposed choices.

Published in:

Computer Vision, 2007. ICCV 2007. IEEE 11th International Conference on

Date of Conference:

14-21 Oct. 2007

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.