Cart (Loading....) | Create Account
Close category search window
 

Charge-Based Compact Modeling of Multiple-Gate MOSFET

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Iniguez, B. ; Univ. Rovira i Virgili, Tarragona ; Lazaro, A. ; El Hamid, H.A. ; Moldovan, O.
more authors

We present new compact modeling techniques which have been applied for different types of multiple-gate MOSFETs: double-gate MOSFETs, gate all around MOSFETs and FinFETs. Long channel models are obtained by deriving a unified charge control model from the solution the 1-D Poisson's equation (considering volume inversion), and using it in an adequate transport model. The final channel current, charge and capacitance models are written in terms of the charge sheet densities at the source and drain ends of the channel. The short-channel effects can be easily incorporated to this unified model. Analytical and scalable models for the subthreshold swing, threshold voltage roll-off and DIBL have been developed by solving the 2-D or 3-D Poisson equation using appropriate techniques; these models are also based on a physical analysis of the conduction path. We observed a very good agreement with 2-D and 3-D numerical simulations of the characteristics of the different multiple-gate devices. Finally, using the active transmission line approach, we extended our compact models to the high frequency operation, in order to study the RF performance, including noise.

Published in:

Custom Integrated Circuits Conference, 2007. CICC '07. IEEE

Date of Conference:

16-19 Sept. 2007

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.