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RF MEMS Testing - Beyond the S-Parameters

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3 Author(s)
John L. Ebel ; Wright-Patterson AFB, Wright-Patterson AFB ; Daniel J. Hyman ; Harvey S. Newman

This article surveys a variety of tests and measurements that have been used for switch and relay characterization, and it describes their strengths, weaknesses, and applicability in the design and development process.

Published in:

IEEE Microwave Magazine  (Volume:8 ,  Issue: 6 )