Cart (Loading....) | Create Account
Close category search window
 

Sufficient and ε-sufficient statistics in pattern recognition and their relation to fuzzy techniques

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Bialasiewicz, J. ; Dept. of Electr. Eng. & Comput. Sci., Colorado Univ., Denver, CO, USA

An approach to the selection of essential features of objects to be recognized, which is based on sufficient and ε-sufficient statistics, is presented. It is shown how sufficient and ε-sufficient statistics can be used to construct partitions of the space of outcomes of an experiment in order to simplify the pattern recognition process. Whereas the sufficient partitions involve inexactness represented by exact statistical information, the use of ε-sufficient partitions simplifies the decision-making process but at the same time introduces additional inexactness or fuzziness. The relation of ε-sufficient data reduction to fuzzy techniques is shown by defining the grade of membership and the degree of fuzziness in terms of the model introduced

Published in:

Systems, Man and Cybernetics, IEEE Transactions on  (Volume:19 ,  Issue: 5 )

Date of Publication:

Sep/Oct 1989

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.