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Parallel Genetic Algorithm of Test Generation For Digital Circuits

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3 Author(s)
Y. A. Skobtsov ; Donetsk National Technical University, Artema Str., 58, Donetsk, 83000, UKRAINE, E-mail: ; A. I. El-Khatib ; D. E. Ivanov

The parallel genetic algorithms are considered for problem of test generation. The different forms of parallelization of genetic algorithms are investigated for test generation.

Published in:

Modern Problems of Radio Engineering, Telecommunications, and Computer Science, 2006. TCSET 2006. International Conference

Date of Conference:

Feb. 28 2006-March 4 2006