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Parallel Genetic Algorithm of Test Generation For Digital Circuits

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3 Author(s)
Skobtsov, Y.A. ; Donetsk Nat. Tech. Univ., Donetsk ; El-Khatib, A.I. ; Ivanov, D.E.

The parallel genetic algorithms are considered for problem of test generation. The different forms of parallelization of genetic algorithms are investigated for test generation.

Published in:

Modern Problems of Radio Engineering, Telecommunications, and Computer Science, 2006. TCSET 2006. International Conference

Date of Conference:

Feb. 28 2006-March 4 2006