By Topic

An Improved ADC-Error-Correction Scheme Based on a Bayesian Approach

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
De Vito, L. ; Sannio Univ., Benevento ; Michaeli, L. ; Rapuano, S.

The paper presents an improved method for analog-to-digital-converter (ADC) nonlinearity correction based on a Bayesian-filtering approach. In particular, the dependence of a previous method version on the statistical characterization of the input signal has been removed. Now, the method can work on whatever stimulus signal is used without a priori knowledge about it. The proposed improvement has been validated by a numerical simulation using behavioral models provided by an ADC manufacturer and by an experiment in real ADCs.

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:57 ,  Issue: 1 )