Referenced Items are not available for this document.
This paper describes techniques for mitigating single event upsets in master-slave flip-flop latches in 65 nm SOI device technology. Techniques are explained, modeled, and measured with hardware experiments.
Published in:
Nuclear Science, IEEE Transactions on
(Volume:54
,
Issue:
6
)
Date of Publication: Dec. 2007
- Page(s):
- 2021 - 2027
- ISSN :
- 0018-9499
- INSPEC Accession Number:
- 10062077
- Digital Object Identifier :
- 10.1109/TNS.2007.909707
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 12 December 2007
- Issue Date :
- Dec. 2007
- Sponsored by :
- IEEE Nuclear and Plasma Sciences Society
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