Referenced Items are not available for this document.
The electrical and electromechanical properties of piezoelectric thin films were measured using different measurement procedures including a new method which combines the measurement of both the effective longitudinal and transverse piezoelectric coefficients on the same sample under precisely defined homogeneous mechanical strain utilizing a 4-point bending setup. Stress and corresponding strain distributions in the film were verified by finite element simulations.
Published in:
Applications of Ferroelectrics, 2007. ISAF 2007. Sixteenth IEEE International Symposium on
Date of Conference: 27-31 May 2007
- Page(s):
- 702
- ISSN :
- 1099-4734
- E-ISBN :
- 978-1-4244-1334-8
- Print ISBN:
- 978-1-4244-1334-8
- INSPEC Accession Number:
- 9833680
- Conference Location :
- Nara
- Digital Object Identifier :
- 10.1109/ISAF.2007.4393376
- Product Type:
- Conference Publications
About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies
A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.
