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SystemC transaction level modeling (TLM) is widely used to reduce the overall design and validation effort of complex system-on-chip (SOC) architectures. Due to lack of efficient techniques, the amount of reuse between abstraction levels is limited in many scenarios such as reuse of TLM level tests for RTL validation. This paper presents a top-down methodology for generation of RTL tests from SystemC TLM specifications. This paper makes two important contributions: automatic test generation from TLM specification using a transition-based coverage metric and automatic translation of TLM tests into RTL tests using a set of transformation rules. Our initial results using a router design demonstrate the usefulness of our approach by capturing various functional errors as well as inconsistencies in the implementation.
Date of Conference: 7-9 Nov. 2007