Cart (Loading....) | Create Account
Close category search window

Flux density and energy perturbations in adaptive finite element mesh generation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Hoole, S.R.H. ; Dept. of Eng., Harvey Mudd Coll., Claremont, CA, USA ; Jayakumaran, S. ; Hoole, N.R.G.

A simple, easy-to-use scheme for the adaptive refinement of finite element meshes is introduced. The changes in the flux densities and energy contributions of finite elements from iteration to iteration are monitored, and elements in which the changes are more than a preassigned percentage are selected for refinement. Working with first-order triangular elements, whenever a triangle has to be refined, each of the three edges of the triangle is cut into two by placing a node in the middle. This scheme presents a natural extension of the nodal perturbation scheme. It is shown that combining the three criteria results in more accuracy, and studiedly moving the location of a new node on an edge away from the middle reduces the computational cost

Published in:

Magnetics, IEEE Transactions on  (Volume:24 ,  Issue: 1 )

Date of Publication:

Jan 1988

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.