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Investigation of Contact Properties in Carbon Nanotube Transistors Using Scanning Photocurrent Microscopy

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3 Author(s)
Jaeku Park ; Division of Energy Systems Research, Ajou University, Suwon 443-749, Korea ; Y. H. Ahn ; Jiwoong Park

Scanning photocurrent measurements are demonstrated in individual carbon nanotube field- effect transistors. Photocurrent images in conjunction with the electrical conductance measurement elucidate the properties of metal-CNT interfaces, especially the electron band alignment at the contact.

Published in:

Lasers and Electro-Optics - Pacific Rim, 2007. CLEO/Pacific Rim 2007. Conference on

Date of Conference:

26-31 Aug. 2007