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Characterization of domain switching behavior of MTJ cells using magnetic force microscopy(MFM) and H-R loop analysis

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4 Author(s)
Jinhee Heo ; SungKyunKwan Univ., Suwon ; Kyohyeok Kim ; Taewan Kim ; Ilsub Chung

Correlationship between electrical and magnetic properties of magnetic tunnel junction (MTJ) for Magnetic Random Access Memory(MRAM) was studied. MTJ (Ta/NiFeCr/PtMn/CoFe/Ru/CoFe/AlOx/CoFe/NiFe/Ta) was analyzed utilizing H-R loop and MFM images. We verified that the kink in H-MR loop comes from the vortex domain of free layer. In addition, we also observed a close relationship between domain switching behavior and anomalous H-R curve. These results would be useful for characterization of MTJ cell, thereby optimizing the process to realize the ultra high density MRAM.

Published in:

Nanotechnology Materials and Devices Conference, 2006. NMDC 2006. IEEE  (Volume:1 )

Date of Conference:

22-25 Oct. 2006

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