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This paper addresses the generation of accurate macromodels of digital ICs accounting for both the functional and the out-of-band behaviour of devices. The proposed models that can be effectively used for immunity predictions are obtained from port transient responses only and can be implemented in any commercial tool based on SPICE or mixedsignal hardware description languages. The approach is demonstrated on a real test board by injecting a RF noise disturbance into a digital IC: a systematic study comparing actual measurements and simulation predictions is carried out.
Date of Conference: 24-28 Sept. 2007