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Integrated Test Solution for embedded UHF/RF SOC

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2 Author(s)
Lu, S. ; Broadcom Corp., Irvine ; Dee-Won Lee

Modern SOC is trending towards high level integration, UHF/ RF blocks have gradually found their positions in the integration puzzle, such as digital video decoder with integrated satellite set-top box UHF receiver, DOCSIS cable modem with integrated CMOS tuner. Instead of adding 6-digits capital investment to upgrade the ATE system with full-spectrum RF test option and retrain mixed signal test engineer to be fluent with RF terminology, this paper explores an alternate approach of combining a "familiar" bench RF signal generator with standard mixed-signal test configuration to provide a "just-enough" test solution for embedded UHF and RF SOC ICs. The external RF signal generator is not new to ATE world, it has been used as alternate master clock for multi-clock domain ATE system, and now it finds its new position as a low-cost accurate RF source to test UHF/RF blocks which only require a programmable RF stimulus. The RF signal generator can provide a wide frequency range and low output power with outstanding phase-noise performance and analog modulation features. It can be easily integrated with ATE system with high bandwidth co-ax cable and accessible to DUT through pogo pins. The insertion loss calibration of this RF source can be done through PCB pattern coupler on the DUT board with either high speed digitizer or high bandwidth sampler. The output power and frequency of this RF source can be easily controlled through GPIB SICL library call in the test program. The presentation details two UHF tests utilizing this RF source: 1-dB compression test and input sensitivity test. The test performance and test time are discussed.

Published in:

Asian Test Symposium, 2007. ATS '07. 16th

Date of Conference:

8-11 Oct. 2007