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A novel bi-linear planar near-field antenna measurement technique is presented as a superior alternative to other planar near-field measurement techniques. It is shown that the planar far-field can be precisely predicted by measuring the near-field samples just along two intersecting lines instead of undergoing the time taking process of scanning the whole near-field plane. This makes Bi-linear technique a very fast, accurate, and timely efficient near-field measurement method. Through the simulations and theoretical analysis, the advantages and disadvantages of this new technique are discussed and results so far demonstrate its superiority over other planar near-field techniques.