By Topic

Probabilistic Study of the Coupling between Deterministic Electromagnetic Fields and a Stochastic Thin-Wire over a PEC Plane

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Sy, O.O. ; Eindhoven Univ. of Technol., Eindhoven ; Vaessen, J.A.H. ; van Beurden, M.C. ; Tijhuis, A.G.
more authors

A stochastic approach is presented to statistically characterize uncertainties in electromagnetic interactions. A stochastically undulating thin wire over a perfectly conducting ground plane is studied. The aim of this paper is to present methods to compute the statistical moments of the voltage induced by a deterministic incident field. Three methods have been developed to compute these moments: a quadrature method, a perturbation approach and a Monte-Carlo method.

Published in:

Electromagnetics in Advanced Applications, 2007. ICEAA 2007. International Conference on

Date of Conference:

17-21 Sept. 2007