By Topic

Predictions of the Worst-Case Crosstalk Including ISI Effect and the Worst-Case Eye Opening Including Crosstalk Effect for Electronic Packaging System Design

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Zhaoqing Chen ; IBM Corp., Poughkeepsie

New methods for predicting the worst-case crosstalk caused by intersymbol interference and the worst-case eye opening including crosstalk effect are proposed. The new method for predicting the worst-case crosstalk is based on simulated or measured crosstalk caused by a single bit aggressor signal. By using the derived worst-case crosstalk and the no-crosstalk worst-case eye opening, we can get worst-case eye opening including crosstalk effect. The proposed methods are exactly valid for packaging component and system with linear I/O devices as the signal source and load. They can also be extended to some nonlinear I/O cases with approximations.

Published in:

Electrical Performance of Electronic Packaging, 2007 IEEE

Date of Conference:

29-31 Oct. 2007