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A Comparison of Fast Methods for Measuring NBTI Degradation

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5 Author(s)

Three fast measuring methods, namely, "on-the-fly," fast direct threshold-voltage (VT) determination, and fast drain-current measurement near VT, are compared. Problems of the different methods are thoroughly discussed, and an analysis of systematic and statistical errors has been done. An example comparing the VT data extracted from the three methods is given. The results help us to understand the root causes for the observed differences in drift curves.

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Device and Materials Reliability, IEEE Transactions on  (Volume:7 ,  Issue: 4 )