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Optical and Holographic Properties of Nano-Sized Amorphous Semiconductor Films as a Part of Optically Addressed Spatial Light Modulator

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4 Author(s)
S. Sainov ; Central Laboratory of Optical Storage and Processing of Information, Bulgarian Academy of Sciences, 1113 Sofia, P.O.Box 95, Bulgaria ; V. Sainov ; J. Dikova ; K. Beev

The experimental results as well as the theoretical background of evanescent wave holographic recording of gratings with 3.2, 0.88 and 0.37 mum pitch (corresponding to spatial frequencies of 310, 1140 and 2700 mm-1) in nano-sized As2S3 films are presented. The thickness of the recording medium is 29 nm. The grating recording is performed using the interference of surface-propagated reference evanescent waves, created by the total internal light reflection and homogeneous object wave. The optical characteristics of the chalcogenide films -the refractive and absorption indexes are determined by spectrophotometric measurements in the wavelength range of 250-650 nm. The examinations are connected to the application of the As2S3 films as a photosensitive part of optically addressed spatial light modulator working in total internal reflection mode.

Published in:

2007 3DTV Conference

Date of Conference:

7-9 May 2007