Cart (Loading....) | Create Account
Close category search window
 

Optical and Holographic Properties of Nano-Sized Amorphous Semiconductor Films as a Part of Optically Addressed Spatial Light Modulator

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Sainov, S. ; Bulgarian Acad. of Sci., Sofia ; Sainov, V. ; Dikova, J. ; Beev, K.

The experimental results as well as the theoretical background of evanescent wave holographic recording of gratings with 3.2, 0.88 and 0.37 mum pitch (corresponding to spatial frequencies of 310, 1140 and 2700 mm-1) in nano-sized As2S3 films are presented. The thickness of the recording medium is 29 nm. The grating recording is performed using the interference of surface-propagated reference evanescent waves, created by the total internal light reflection and homogeneous object wave. The optical characteristics of the chalcogenide films -the refractive and absorption indexes are determined by spectrophotometric measurements in the wavelength range of 250-650 nm. The examinations are connected to the application of the As2S3 films as a photosensitive part of optically addressed spatial light modulator working in total internal reflection mode.

Published in:

3DTV Conference, 2007

Date of Conference:

7-9 May 2007

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.